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Volumn 37, Issue 12 B, 1998, Pages 6718-6722
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Proposal for the coma aberration dependent overlay error compensation technology
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HITACHI LTD
(Japan)
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Author keywords
Absolute correction; Coma aberrations; Lens distortion correction method; Overlay error; Pattern placement error corrected mask; Relative correction
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Indexed keywords
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EID: 19644389377
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.37.6718 Document Type: Article |
Times cited : (1)
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References (9)
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