Excited states mapped by secondary photoemission

Physical Review Letters

Volumn 93, Issue 10, 2004, Pages

  Bovet, M ^a   Strocov, V N ^b   Clerc, F ^a   Koitzsch, C ^a   Naumovic D ^c   Aebi, P ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c UNIVERSITY OF FRIBOURG   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; BAND STRUCTURE; BINDING ENERGY; CRYSTALLINE MATERIALS; ELECTRON ENERGY LEVELS; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; MAGNESIUM PRINTING PLATES; PHOTOEMISSION; RELAXATION PROCESSES; SECONDARY EMISSION; SURFACES; THERMODYNAMICS; VACUUM APPLICATIONS; X RAY DIFFRACTION;

ANGLE-RESOLVED PHOTOEMISSION (ARPES); BAND MAPPING; ENERGY DISTRIBUTION CURVES (EDC); THREE-DIMENSIONAL (3D) MATERIALS; VERY LOW-ENERGY ELECTRON DIFFRACTION (VLEED);

COPPER;

EID: 19544367974     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.107601     Document Type: Article

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