New method for absolute band structure determination by combining photoemission with very-low-energy electron diffraction: Application to layered VSe2

Physical Review Letters

Volumn 79, Issue 3, 1997, Pages 467-470

  Strocov, V N ^a   Starnberg, H I ^a   Nilsson, P O ^a   Brauer, H E ^a   Holleboom, L J ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CALCULATIONS; LOW ENERGY ELECTRON DIFFRACTION; MATHEMATICAL TECHNIQUES; OPTIMIZATION; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; VANADIUM COMPOUNDS;

VANADIUM SELENIDE; VERY LOW ELECTRON DIFFRACTION;

BAND STRUCTURE;

EID: 0031190933     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.79.467     Document Type: Article

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