Thickness monitoring of optical filters for DWDM applications

Optics Express

Volumn 11, Issue 6, 2003, Pages 610-616

  Postava, Kamil ^a   Pištora, Jaromír ^a   Kojima, Masashi ^b   Kikuchi, Kazuo ^b   Endo, Kazuhiro ^b   Yamaguchi, Tomuo ^c  

^a VSB TECHNICAL UNIVERSITY OF OSTRAVA   (Czech Republic)

^b Tech I Co Ltd   (Japan)

^c SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; BANDPASS FILTERS; DENSE WAVELENGTH DIVISION MULTIPLEXING; FIBER OPTICS; MONOCHROMATORS; MULTILAYERS; OPTICAL COATINGS; OPTICAL COMMUNICATION; OPTICAL SWITCHES; THIN FILMS;

MONOCHROMATOR BANDPASS; NARROW-BAND-PASS-FILTER (NBPF); TRANSMITTANCE;

OPTICAL FILTERS;

EID: 1942498008     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.11.000610     Document Type: Article

References (17)

1. J. J. Pan, F. Q. Zhou, and M. Zhou, "Thin films improve 50-GHz DWDM devices," Laser Focus World pp. 111-116 (2002).
2. F. Q. Zhou, M. Zhou, and J. J. Pan, "Optical coating computer simulation of narrow bandpass filters for dense wavelength division multiplexing," In Optical Interference Coating, OSA Technical Digest Series 9, 223-224 (1988).
3. K. Zhang, J. Wang, E. Schwendeman, D. Dawson-Elli, R. Faber, and R. Sharps, "Group delay and chromatic dispersion of thin-film-based, narrow bandpass filters used in dense wavelength-division-multiplexed systems," Appl. Opt. 41, 3172-3175 (2002).
4. A. Zöller, G. Götzelmann, K. Matl, and D. Gushing, "Temperature-stable bandpass filters deposited with plasma ion-assisted deposition," Appl. Opt. 35, 5609-5612 (1996).
5. H. A. Macleod, Thin-film optical filters (Adam Hilger Ltd, Bristol, 1986).
6. A. V. Tikhonravov and M. K. Trubetskov, "Automated design and sensitivity analysis of wavelength-division multiplexing filters," Appl. Opt. 41, 3176-3182 (2002).
7. R. Faber, K. Zhang, and A. Zoeller, "Design and manufacturing of WDM narrow band interference filters," In Optical and Infrared Thin Films, M. L. Pulton, ed., Proc. of SPIE 4094, 58-64 (2000).
8. P. W. Baumeister, "Design of a coarse WDM bandpass filter using the Thelen bandpaas design method," Opt. Express 9, 652-657 (2001), http://www.opticsexpress.org/abstract.cfm?URI=OPEX-9-12-652
9. P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, and P. Roche, "Optical filters: Monitoring process allowing the auto-correlation of thickness errors," Thin Solid Films 13, 285-290 (1972).
10. R. R. Willey, "Simulation of errors in the monitoring of narrow bandpass filters," Appl. Opt. 41, 3193-3195 (2002).
11. B. T. Sullivan and J. A. Dobrowolski, "Deposition error compensation for optical multilayer coatings. I. Theoretical description," Appl. Opt. 31, 3821-3835 (1992).
12. B. T. Sullivan, G. A. Clarke, T. Akiyama, N. Osborne, M. Rangel, J. A. Dobrowolski, L. Howe, A. Matsumoto, Y. Song, and K. Kikuchi, "High-rate automated deposition system for the manufacture of complex multilayer coatings," Appl. Opt. 39, 157-167 (2000).
13. C. Schroedter, "An evaporation monitoring system featuring software trigger points and on line evaluation of refractive indices," In Thin Film Technologies II, Proc. of SPIE 652, 15-20 (1986).
14. R. R. Willey, "Achieving narrow bandpass filters which meet the requirements for DWDM," Thin Solid Films 398-399, 1-9 (2001).
15. K. Postava, T. Yamaguchi, and R. Kantor, "Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures," Appl. Opt. 41, 2521-2531 (2002).
16. L. Mandel and E. Wolf, Optical Coherence and Quantum Optics (Cambridge, New York, 1995).
17. K. Postava, T. Yamaguchi, and T. Nakano, "Characterization of organic low-dielectric-constant materials using optical spectroscopy," Opt. Express 9, 141-151 (2001), http://www.opticsexpress.org/oearchive/source/32940. htm