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Volumn 41, Issue 16, 2002, Pages 3172-3175

Group delay and chromatic dispersion of thin-film-based, narrow bandpass filters used in dense wavelength-division-multiplexed systems

Author keywords

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Indexed keywords


EID: 0036602913     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.003172     Document Type: Article
Times cited : (22)

References (7)
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    • General IIR optical filter design for WDM applications using all-pass filters
    • C. K. Madsen, “General IIR optical filter design for WDM applications using all-pass filters,” J. Lightwave Technol. 18,860 -868 (2000).
    • (2000) J. Lightwave Technol , vol.18
    • Madsen, C.K.1
  • 4
    • 6144250894 scopus 로고    scopus 로고
    • Temperature-stable bandpass filters deposited with plasma ion-assisted deposition
    • A. Zoller, R. Gotzelmann, K. Matl, and D. Cushing, “Temperature-stable bandpass filters deposited with plasma ion-assisted deposition,” Appl. Opt. 35, 5609-5612 (1996).
    • (1996) Appl. Opt. , vol.35 , pp. 5609-5612
    • Zoller, A.1    Gotzelmann, R.2    Matl, K.3    Cushing, D.4
  • 5
    • 3543110456 scopus 로고    scopus 로고
    • Bandpass filters for wavelength division multiplexing—modification of the spectral bandwidth
    • P. Baumeister, “Bandpass filters for wavelength division multiplexing—modification of the spectral bandwidth,” Appl. Opt. 37, 6609-6614 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 6609-6614
    • Baumeister, P.1
  • 6
    • 0034276015 scopus 로고    scopus 로고
    • Roughness and chemistry of silicon and polysilicon surface etched in high-density plasma: XPS, AFM and ellipsometry analysis
    • L. Rolland, C. Vallee, M. C. Peignon, and C. Cardinaud, “Roughness and chemistry of silicon and polysilicon surface etched in high-density plasma: XPS, AFM and ellipsometry analysis,” Appl. Surf. Sci. 164, 147-155 (2000).
    • (2000) Appl. Surf. Sci. , vol.164 , pp. 147-155
    • Rolland, L.1    Vallee, C.2    Peignon, M.C.3    Cardinaud, C.4
  • 7
    • 0033170276 scopus 로고    scopus 로고
    • Surface roughness characterization of smooth optical films deposited by ion plating
    • S. Jakobs, A. Duparre, M. Huter, and H. K. Pulker, “Surface roughness characterization of smooth optical films deposited by ion plating,” Thin Solid Films, 351, 141-145 (1999).
    • (1999) Thin Solid Films , vol.351 , pp. 141-145
    • Jakobs, S.1    Duparre, A.2    Huter, M.3    Pulker, H.K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.