Non-destructive characterization for dielectric loss of low permittivity substrate materials

Measurement Science and Technology

Volumn 15, Issue 4, 2004, Pages 747-754

  Fang, Xiang Yi ^a   Linton, David ^a   Walker, Chris ^b   Collins, Brian ^c  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^b Gaisler Research   (United Kingdom)

^c CSA Ltd   (United Kingdom)

Author keywords

Complex permittivity; Loss tangent; Network analyser; Non destructive measurement; Split resonator; Substrate characterization

Indexed keywords

MATHEMATICAL MODELS; PERMITTIVITY; RESONATORS; SUBSTRATES; WAVE EFFECTS;

FULL-WAVE ANALYSIS; LOSS TANGENT;

DIELECTRIC LOSSES;

MEASUREMENT METHOD;

EID: 1942466679     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/15/4/019     Document Type: Article

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