SCOPUS 정보 검색 플랫폼

Volumn 11, Issue 3, 2001, Pages 118-120

A simple method for accurate loss tangent measurement of dielectrics using a microwave resonant cavity

Author keywords

Dielectric constant; Loss tangent; Microwave measurement; Perturbation method; Resonant cavity

Indexed keywords

MICROWAVE RESONANT CAVITY;

CAVITY RESONATORS; MICROWAVE MEASUREMENT; MULTICHIP MODULES; NATURAL FREQUENCIES; PERMITTIVITY; WAVEGUIDES;

DIELECTRIC MATERIALS;

EID: 0035284282 PISSN: 15311309 EISSN: None Source Type: Journal
DOI: 10.1109/7260.915622 Document Type: Article

Times cited : (28)

References (6)

1
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2
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- Advanced thick film technology - The new generation
- Venice, Italy, May
- (1997) Proc. 11th Eur. Microelectronics Conf. , pp. 221-228
- Barnwell, P.¹ Wood, J.²

3
- 0006587064
- Microwave material characterization
- Minneapolis, MN, Oct.
- (1996) Proc. ISHM'96 , pp. 494-499
- Amey, D.I.¹ Horowitz, S.J.²

4
- 0029386687
- Relative permittivity measurement of thick-film dielectrics at microwave frequencies
- (1995) Electron. Lett. , vol.31 , Issue.21 , pp. 1812-1814
- Huang, H.¹ Free, C.E.² Pitt, K.E.G.³ Berzins, A.R.⁴ Shorthouse, G.P.⁵

5
- 0004134620
- Brooklyn, NY: Brooklyn Polytechnic Inst. Press
- (1963) Handbook of Microwave Measurements , vol.2
- Sucher, M.¹ Fox, J.²

6
- 0003823465
- London, U.K.: Electrochemical Publ.
- (1976) Handbook of Thick Film Technology
- Holmes, P.J.¹ Loasby, R.J.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.