The gap correction for the resonant-mode dielectrometer

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 1, 1996, Pages 98-101

  Kent, Gordon ^a,b   Bell, Steven M ^c  

^a IEEE

^b GDK Products   (United States)

^c Trans Tech Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CAVITY RESONATORS; DIELECTRIC MATERIALS; SAPPHIRE;

GAP EFFECT; RESONANT MODE DIELECTROMETER;

PERMITTIVITY MEASUREMENT;

EID: 0030086698     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.481318     Document Type: Article

References (3)

1. G. Kent, "Nondestructive permittivity measurement of substrates," IEEE Trans. Instrum. Meas., this issue, pp. 102-106.
2. M. Abramowitz and I. A. Stegun, Ed., Handbook of Mathematical Functions. New York: Dover, 1964.
3. A. von Hippel, Handbook of Physics, E. U. Condon and H. Odishaw, Eds. New York: McGraw, ch. 7, 1958.