Advances in automatic TEM based orientation mapping

Solid State Phenomena

Volumn 105, Issue , 2005, Pages 37-42

  Fundenberger, J J ^a   Morawiec, A ^b   Bouzy, E ^a  

^a UNIVERSITÉ PAUL VERLAINE METZ   (France)

^b INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

Author keywords

Diffraction; Microstructure; Orientation mapping; Transmission electron microscopy

Indexed keywords

CHARGE COUPLED DEVICES; CRYSTAL ORIENTATION; DIFFRACTION; MICROSTRUCTURE; THERMODYNAMIC STABILITY; TITANIUM ALLOYS;

ELECTRON BACK SCATTERED DIFFRACTION (EBSD); KIKUCHI PATTERNS; MISORIENTATION DISTRIBUTION; ORIENTATION MAPPING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 19344363175     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.105.37     Document Type: Conference Paper

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