TEM orientation mapping applied to the study of shear band formation

Microchimica Acta

Volumn 147, Issue 3, 2004, Pages 181-186

  Paul, Henryk ^a   Morawiec, Adam ^a   Bouzy, Emmanuel ^b   Fundenberger, Jean Jacques ^b   Pia̧tkowski, Andrzej ^a  

^a INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

^b CNRS   (France)

Author keywords

Copper; Electron diffraction; Microtexture; Orientation imaging maps; Shear bands

Indexed keywords

EID: 19344372887     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00604-004-0189-3     Document Type: Article

References (14)

1. Wagner P, Engler O, Lücke K (1995) Acta Metall Mater 43: 3799-3812
2. Duggan B J, Hatherly M, Hutchinson W B, Wakefield P T (1978) Metal Sci 12: 343-351
3. Hutchinson W B, Duggan B J, Hatherly M (1979) Metals Techn 6: 398-403
4. Morii K, Mecking H, Nakayama Y (1985) Acta Metall 33: 379-386
5. Jasieński Z, Paul H, Pia̧tkowski A, Litwora A (1995) J Mat Proc Techn 53: 187-194
6. Paul H, Driver J H, Jasieński Z (2002) Acta Mater 50: 815-830
7. Paul H, Driver J H, Maurice C, Jasieński Z (2003) Mat Sci Eng A359: 178-191
8. Paul H, Driver J H, Maurice C, Jasieński Z (2002) Acta Mater 50: 4339-4355
9. Wasserman G Z (1963) Z Metallkd 54: 61-65
10. Hirsch J R (1990) Mat Sci Techn 6: 1048-1057
11. Korbel A, Embury J D, Hatherly M, Martin P L, Erbsloh H W (1986) Acta Metall 34: 1999-2009
12. Lee C S, Duggan B J (1994) Mat Sci Techn 10: 155-161
13. El-Danaf E, Kalidindi S R, Doherty R D, Necker C (2000) Acta Mater 48: 2665-2673
14. Morawiec A, Fundenberger J J, Bouzy E, Lecomte J S (2002) J Appl Cryst 35: 287