-
1
-
-
85020150457
-
"Evolution und revolution der smart power ICs"
-
Feb. 01
-
M. Lenz, "Evolution und revolution der smart power ICs," Design Elektron., pp. 66-71, Feb. O1.
-
Design Elektron.
, pp. 66-71
-
-
Lenz, M.1
-
2
-
-
0004208995
-
-
eds., Munich, Germany: Springer
-
B. Murari, F. Bertotti, and G. A. Vignola, Eds., Smart Power ICs: Technologies and Applications. Munich, Germany: Springer, 1995.
-
(1995)
Smart Power ICs: Technologies and Applications
-
-
Murari, B.1
Bertotti, F.2
Vignola, G.A.3
-
3
-
-
84997464479
-
"High temperature electronics for automotive applications"
-
R. Constapel, J. Freytag, P. Hille, V. Lauer, and W. Wondrak, "High temperature electronics for automotive applications," in Proc. Int. Conf. Integrated Power Systems (CIPS'00), pp. 46-53.
-
Proc. Int. Conf. Integrated Power Systems (CIPS'00)
, pp. 46-53
-
-
Constapel, R.1
Freytag, J.2
Hille, P.3
Lauer, V.4
Wondrak, W.5
-
6
-
-
4544325665
-
"Coupled bipolar transistors as very robust ESD protection devices for automotive applications"
-
N. Jensen, G. Groos, M. Denison, J. Kuzmik, D. Pogany, E. Gornik, and M. Stecher, "Coupled bipolar transistors as very robust ESD protection devices for automotive applications," in Proc. 25th EOS/ESD Symp., vol. 313, 2003.
-
(2003)
Proc. 25th EOS/ESD Symp.
, vol.313
-
-
Jensen, N.1
Groos, G.2
Denison, M.3
Kuzmik, J.4
Pogany, D.5
Gornik, E.6
Stecher, M.7
-
8
-
-
0036540916
-
"A double RESURF LDMOS with drain profile engineering for improved ESD robustness"
-
Apr
-
V. Parthasarathy, V. Khemka, R. Zhu, J. Whitfield, A. Bose, and R. Ida, "A double RESURF LDMOS with drain profile engineering for improved ESD robustness," IEEE Electron Device Lett., vol. 23, no. 4 pp. 212-214, Apr. 2002.
-
(2002)
IEEE Electron Device Lett.
, vol.23
, Issue.4
, pp. 212-214
-
-
Parthasarathy, V.1
Khemka, V.2
Zhu, R.3
Whitfield, J.4
Bose, A.5
Ida, R.6
-
9
-
-
5444234354
-
"Moving current filaments in integrated DMOS transistors under short-duration current stress"
-
Oct
-
M. Denison, M. Blaho, P. Rodin, V. Dubec, D. Pogany, D. Silber, E. Gornik, and M. Stecher, "Moving current filaments in integrated DMOS transistors under short-duration current stress," IEEE Trans. Electron Devices, vol. 25, no. 10, pp. 1695-1703, Oct. 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.25
, Issue.10
, pp. 1695-1703
-
-
Denison, M.1
Blaho, M.2
Rodin, P.3
Dubec, V.4
Pogany, D.5
Silber, D.6
Gornik, E.7
Stecher, M.8
-
10
-
-
0032665190
-
"Experimental study of hot-carrier effects in LDMOS transistors"
-
Jun
-
R. Versari and A. Pieracci, "Experimental study of hot-carrier effects in LDMOS transistors," IEEE Trans. Electron Devices, vol. 46, no. 6, pp. 1228-1232, Jun. 1999.
-
(1999)
IEEE Trans. Electron Devices
, vol.46
, Issue.6
, pp. 1228-1232
-
-
Versari, R.1
Pieracci, A.2
-
11
-
-
0034449593
-
-
J. M. Bosc, I. Percheron-Garcon, E. Huynth, P. Lance, I. Pages, J. M. Dorkel, and G. Sarrabayrouse, Proc. ISPSD'00, 2000, pp. 165-168.
-
(2000)
Proc. ISPSD'00
, pp. 165-168
-
-
Bosc, J.M.1
Percheron-Garcon, I.2
Huynth, E.3
Lance, P.4
Pages, I.5
Dorkel, J.M.6
Sarrabayrouse, G.7
-
12
-
-
0141942912
-
-
H. V. Nguyen, C. Salm, J. Vroemen, J. Voets, B. Krabbenborg, J. Bisschop, A. J. Mouthaan, and F. G. Kuper, Microelectron Reliability, vol. 42, no. 9-11, pp. 1415-1420, 2002.
-
(2002)
Microelectron Reliability
, vol.42
, Issue.9-11
, pp. 1415-1420
-
-
Nguyen, H.V.1
Salm, C.2
Vroemen, J.3
Voets, J.4
Krabbenborg, B.5
Bisschop, J.6
Mouthaan, A.J.7
Kuper, F.G.8
-
13
-
-
84906670509
-
-
P. Spirito, G. Breglio, V. d'Alessandro, and N. Rinaldi, Proc. MIEL'02, vol. 1, 2002, pp. 23-30.
-
(2002)
Proc. MIEL'02
, vol.1
, pp. 23-30
-
-
Spirito, P.1
Breglio, G.2
d'Alessandro, V.3
Rinaldi, N.4
-
14
-
-
4944247332
-
"Influence of inhomogeneous current distribution on the SOA of integrated DMOS transistors"
-
M. Denison, M. Pfost, K.-W. Pieper, S. Maerkl, D. Metzner, and M. Stecher, "Influence of inhomogeneous current distribution on the SOA of integrated DMOS transistors," in Proc. ISPSD'04, 2004, pp. 409-412.
-
(2004)
Proc. ISPSD'04
, pp. 409-412
-
-
Denison, M.1
Pfost, M.2
Pieper, K.-W.3
Maerkl, S.4
Metzner, D.5
Stecher, M.6
-
15
-
-
4243577631
-
"Integriertes energie- und datenübertragungssystem, modelbildung und systemorientierte optimierung von monolithisch integrierten mikrospulen"
-
Ph.D. dissertation, Fachbereich Phys. Elektrotech., Univ. Bremen, Bremen, Germany
-
K. Krieger, "Integriertes energie- und datenübertragungssystem, modelbildung und systemorientierte optimierung von monolithisch integrierten mikrospulen," Ph.D. dissertation, Fachbereich Phys. Elektrotech., Univ. Bremen, Bremen, Germany, 1999.
-
(1999)
-
-
Krieger, K.1
-
16
-
-
0032656187
-
"Coreless PCB transformers for power MOSFET/IGBT gate drive circuits"
-
May
-
Y. Hui, H. S.-H. Chung, and S. C. Tang, "Coreless PCB transformers for power MOSFET/IGBT gate drive circuits," IEEE Trans. Power Electron., vol. 14, no. 3, pp. 422-430, May 1999.
-
(1999)
IEEE Trans. Power Electron.
, vol.14
, Issue.3
, pp. 422-430
-
-
Hui, Y.1
Chung, H.S.-H.2
Tang, S.C.3
-
17
-
-
19144362259
-
"A monolithic transformer in control circuitry of power electronics"
-
Kosice, Slovak Republic
-
B. Strzalkowski, "A monolithic transformer in control circuitry of power electronics," in Proc. EDPE'01, Kosice, Slovak Republic, 2001.
-
(2001)
Proc. EDPE'01
-
-
Strzalkowski, B.1
-
18
-
-
0032186601
-
"Analysis, design, and optimization of spiral inductors and transformers for SI RF ICs"
-
Oct
-
Niknejad and R. Meyer, "Analysis, design, and optimization of spiral inductors and transformers for SI RF ICs," IEEE J. Solid State Circuits, vol. 33, no. 10, pp. 1470-1481, Oct. 1998.
-
(1998)
IEEE J. Solid State Circuits
, vol.33
, Issue.10
, pp. 1470-1481
-
-
Niknejad1
Meyer, R.2
-
19
-
-
19144366092
-
"Coreless transformer a new technology for driver ICs"
-
Nürnberg, Germany
-
K. Kaschani, B. Strzalkowski, M. Münzer, and W. Ademmer, "Coreless transformer a new technology for driver ICs," in Proc. PCIM'03, Nürnberg, Germany, 2003.
-
(2003)
Proc. PCIM'03
-
-
Kaschani, K.1
Strzalkowski, B.2
Münzer, M.3
Ademmer, W.4
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