Thermal instabilities in high current power MOS devices: Experimental evidence, electro-thermal simulations and analytical modeling

2002 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings

Volumn 1, Issue , 2002, Pages 23-30

  Spirito, P ^a   Breglio, G ^a   D'Alessandro, V ^a   Rinaldi, N ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTRONICS;

ANALYTICAL EXPRESSIONS; ELECTRO-THERMAL SIMULATION; EXPERIMENTAL EVIDENCE; HIGH CURRENTS; THERMAL INSTABILITIES; TRANSIENT OPERATION;

THERMODYNAMIC STABILITY;

EID: 84906670509     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIEL.2002.1003144     Document Type: Conference Paper

References (8)

1. P.L.Hower, D.L.Blackburn, S. Rubin, "Thermal characterization of power transistors" IEEE Trans, on Electron Devices, vol. ED-23, pp. 831-838, 1976
2. G. Breglio, F. Frisina, A. Magri, p. Spirito "Electro-thermal instability in low voltage power MOS: experimental characterization" Proc. ISPSD '99, pp. 233-236, Toronto, 1999
3. P. Hower, C. Tsai, S. Merchant, T. Efland, S. Pendharkar, R. Steinhoff, J. Brodsky, "Avalanche induced thermal instability in LDMOS transistors", ISPSD 2001, pp. 153-156
4. G. Breglio, S.Pica, A. Tartaglia, P. Spirito, "Experimental detection of time dependent temperature maps in power bipolar transistors" Proc. of '97 Terminic Workshop, pp., Cannes, France, 1997
5. G. Breglio, N. Rinaldi, P. Spirito, "Thermal mapping and 3D numerical simulation of new cellular power MOS affected by electro-thermal instability" Microelectronics J., Vol. 31/9-10, pp. 741-746, 2000
6. P. Hover, G. Govil, IEEE Trans. ED, ED-21, pp. 617-623, 1974
7. N. Rinaldi, "On the modeling of the transient thermal behavior of semiconductor devices," IEEE Trans, on ED (in print)
8. N. Rinaldi, "Thermal analysis of solid-state devices and circuits: an analytical approach", Solid-State Electronics, vol. 44, pp. 1789-1798, 2000.