Alteration of magnification and image rotation in tilt series of electron microscopic images

Measurement Science and Technology

Volumn 10, Issue 1, 1999, Pages

  Zhang, Halbo ^a,b   Takaoka, Akio ^a  

^a OSAKA UNIVERSITY   (Japan)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Electron microscopy; Image rotation; Magnification; Objective excitation; Specimen tilting

Indexed keywords

IMAGE ANALYSIS; IMAGE ENHANCEMENT; IMAGE PROCESSING; LENSES;

IMAGE ROTATION; MAGNIFICATION; TILT SERIES;

ELECTRON MICROSCOPY;

EID: 0032649285     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/10/1/013     Document Type: Article

References (8)

1. DeRosier D J and Klug A 1968 Reconstruction of three dimensional structures from electron micrographs Nature 217 130-4
2. Zwick M and Zeitler E 1973 Image reconstruction from projections Optik 38 550-65
3. Valdrè U and Tsuno K 1986 A possible design for a high tilt, fully eucentric, goniometer stage Proc. 11th Int. Congress on Electron Microscopy vol 2 (Kyoto: Japanese Society of Electron Microscopy) pp 925-6
4. Takaoka A, Ura K, Mori H, Katsuta T, Matsui I and Hayashi S 1997 Development of a new 3 MV ultra-high voltage electron microscope at Osaka University J. Electron Microsc. 46 447-56
5. See, for example, Mulvey T 1982 Unconventional lens design Magnetic Electron Lenses ed P W Hawkes (Berlin: Springer) pp 370-89
6. Riecke W D 1982 Practical lens design Magnetic Electron Lenses ed P W Hawkes (Berlin: Springer) pp 180-5
7. Hawkes P W and Kasper E 1989 Principles of Electron Optics Volume 2. Applied Geometrical Optics (London: Academic) pp 687-95
8. Zhang H, Murakami T, Takaoka A and Miyauchi K 1998 Electron tomography in an ultrahigh voltage electron microscope with 360°-tilt specimen holder Proc. 14th Int. Congress on Electron Microscopy vol 1 (Bristol: IOP) pp 297-8