Physical properties of AU and AL thin films measured by resistive heating

Surface Review and Letters

Volumn 12, Issue 1, 2005, Pages 101-106

  Aviles F ^a   Ceh, O ^a   Oliva, A I ^a  

^a DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

Author keywords

Aluminum; Gold; Metallic thin films; Resistive thermal coefficients

Indexed keywords

ALUMINUM; COALESCENCE; CRYSTAL ORIENTATION; EVAPORATION; GOLD; MATHEMATICAL MODELS; METALLIC FILMS;

MATERIAL QUALITY; MEAN FREE PATH; RESISTIVE HEATING; RESISTIVE THERMAL COEFFICIENTS;

THIN FILMS;

EID: 18744403128     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X05006834     Document Type: Article

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