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Volumn 38, Issue 10 A, 2005, Pages

X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; CRYSTAL DEFECTS; DOPING (ADDITIVES); MATHEMATICAL MODELS; NITROGEN; SILICON WAFERS; X RAY SCATTERING;

EID: 18744370455     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/10A/020     Document Type: Article
Times cited : (16)

References (18)
  • 11
    • 0019082786 scopus 로고
    • 10.1063/1.327512 0021-8979
    • Hu S M 1980 J. Appl. Phys. 51 5945
    • (1980) J. Appl. Phys. , vol.51 , Issue.11 , pp. 5945
    • Hu, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.