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Volumn 38, Issue 10 A, 2005, Pages
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X-ray diffuse scattering from defects in nitrogen-doped Czochralski grown silicon wafers
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Author keywords
[No Author keywords available]
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Indexed keywords
AGGLOMERATION;
CRYSTAL DEFECTS;
DOPING (ADDITIVES);
MATHEMATICAL MODELS;
NITROGEN;
SILICON WAFERS;
X RAY SCATTERING;
DEFECT DEFORMATION FIELDS;
FLOATING ZONE (FZ);
SELECTIVE ETCHING;
SILICON CRYSTALS;
CRYSTAL GROWTH FROM MELT;
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EID: 18744370455
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/38/10A/020 Document Type: Article |
Times cited : (16)
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References (18)
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