Modelling of dielectric constants of amorphous Zr silicates

Journal of Physics Condensed Matter

Volumn 17, Issue 21, 2005, Pages

  Rignanese, G M ^a   Pasquarello, Alfredo ^b,c  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b EPFL   (Switzerland)

^c INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS ALLOYS; DATA ACQUISITION; DIELECTRIC PROPERTIES; ELECTRON GAS; PERMITTIVITY; SILICA; ZIRCONIUM;

CEPERLEY-ALDER ELECTRON-GAS DATA; OPTICAL DIELECTRIC CONSTANTS; SILICON DIOXIDE GATES; ZR SILICATES;

SILICATES;

EID: 18744362703     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/21/005     Document Type: Article

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