Microstructural characterisation of CuInS2 polycrystalline films sulfurised by rapid thermal processing

Thin Solid Films

Volumn 387, Issue 1-2, 2001, Pages 219-221

  Álvarez García, J ^a   Pérez Rodríguez, A ^a   Romano Rodríguez, A ^a   Calvo Barrio, L ^a   Barcones, B ^a   Morante, J R ^a   Siemer, K ^b   Luck, I ^b   Klenk, R ^b  

^a UNIVERSITY OF BARCELONA   (Spain)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

AES; Chalcopyrite; CuInS2; Raman scattering; Solar cells; TEM

Indexed keywords

COPPER COMPOUNDS; CRYSTAL MICROSTRUCTURE; DEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; POLYCRYSTALLINE MATERIALS; RAPID THERMAL ANNEALING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CHALCOPYRITES; SULFURIZATION;

SOLAR CELLS;

EID: 0035967597     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01836-8     Document Type: Article

References (3)