Formation and transport properties of Si(111)/β-FeSi2/Si nanocluster structures

e-Journal of Surface Science and Nanotechnology

Volumn 3, Issue , 2005, Pages 97-106

  Galkin, N G ^a   Goroshko, D L ^b   Gouralnik, A S ^a   Polyarnyi, V O ^a   Louchaninov, I V ^c   Vavanova, S V ^a  

^a INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

^b VLADIVOSTOK STATE UNIVERSITY OF ECONOMICS AND SERVICE   (Russian Federation)

^c FAR EASTERN FEDERAL UNIVERSITY   (Russian Federation)

Author keywords

Atomic force microscopy; Electrical transport measurements; Epitaxy; Fe; Morphology; Nanocluster materials; Suicides

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; IRON COMPOUNDS; LOW ENERGY ELECTRON DIFFRACTION; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR MATERIALS; SUBLIMATION;

ELECTRICAL TRANSPORT MEASUREMENTS; NANOCLUSTER MATERIALS; QUARTZ SENSORS; SILICIDES;

SILICON;

EID: 18444396891     PISSN: 13480391     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2005.97     Document Type: Article

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