An ultra-high-vacuum system for computer-integrated measurements of the hall effect and conductivity of two-dimensional films

Instruments and Experimental Techniques

Volumn 42, Issue 2, 1999, Pages 284-289

  Galkin, N G ^a   Ivanov, V A ^a   Konchenko, A V ^a   Goroshko, D L ^a  

^a INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012812026     PISSN: 00204412     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. Lifshits, V.G., Saranin, A.A., and Zotov, A.V., Surface Phases on Silicon, Chichester: Wiley, 1994.
2. Tong, X., Hasegawa, S., and Ino, S., Phys. Rev. B: Condens. Matter, 1997, Vol. 55, p. 1310.
3. Gasparov, V.A. and Nikolaev, K.R., Phys. Low-Dim. Struct., 1996, vol. 1/2, p. 53.
4. Hasegawa, S. and Ino, S., Phys. Rev. Lett., 1992, vol. 68, p. 1192.
5. Kuchis, E.V., Metody issledovaniya effekta Kholla (Methods of Hall-Effect Investigations), Moscow: Sov. Radio, 1974, p. 169.
6. Galkin, N.G., Plyusnin, N.I., and Lifshits, V.G., Poverkhnost., 1987, vol. 12, p. 50.
7. Patritz, R.L., Phys. Rev., 1958, vol. 110, p. 1254.