Finite element approximation of a phase field model for void electromigration

SIAM Journal on Numerical Analysis

Volumn 42, Issue 2, 2004, Pages 738-772

  Barrett, John W ^a   Nürnberg, Robert ^a   Styles, Vanessa ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF SUSSEX   (United Kingdom)

Author keywords

Convergence analysis; Degenerate Cahn Hilliard equation; Diffuse interface model; Finite elements; Fourth order degenerate parabolic system; Phase field model; Surface diffusion; Void electromigration

Indexed keywords

APPROXIMATION THEORY; CONVERGENCE OF NUMERICAL METHODS; DIFFUSION; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); ITERATIVE METHODS; MATHEMATICAL MODELS;

CONVERGENCE ANALYSIS; DEGENERATE CAHN-HILLIARD EQUATION; DIFFUSE INTERFACE MODELS; FINITE ELEMENTS; FOURTH ORDER DEGENERATE PARABOLIC SYSTEM; PHASE FIELD MODELS; SURFACE DIFFUSION; VOID ELECTROMIGRATION;

CRACKS;

EID: 18444382709     PISSN: 00361429     EISSN: None     Source Type: Journal    
DOI: 10.1137/S0036142902413421     Document Type: Article

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