Treatment effects on deep levels in CDTE based solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 604-607

  Gilmore, A S ^a   Kaydanov, V ^a   Ohno, T R ^a   Rose, D ^b   Feldman, S D ^a   Erslev, P ^a  

^a Department of Geology and Geological Engineering   (United States)

^b FIRST SOLAR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CRYSTALLIZATION; DEEP LEVEL TRANSIENT SPECTROSCOPY; ETCHING; FREQUENCIES; GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING CADMIUM TELLURIDE;

ADMITTANCE SPECTROSCOPY; CADMIUM CHLORIDE; DRIVE LEVEL CAPACITANCE PROFILING; SPATIAL DISTRIBUTION;

SOLAR CELLS;

EID: 0036954162     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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5. T. Walter, R. Herberholz, C. Muller, and H. W. Schock, J. Appl. Phys, 80 (8) 1996, 4411.
6. C.E. Michelson, A. V. Gelastos, and J. D. Cohen, Appl. Phys. Lett. 47, 1985, 412.