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Volumn 89, Issue 1, 2001, Pages 206-211
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Local crystal analysis using near-field optical second harmonic microscopy: Application to thin ferroelectric films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000233451
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1331342 Document Type: Article |
Times cited : (25)
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References (20)
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