A Self-Consistent Integrated System for Terrestrial-Neutron Induced Single Event Upset of Semiconductor Devices at the Ground

Proceedings of the First International Conference on Information Technology and Applications (ICITA 2002)

Volumn , Issue , 2002, Pages 853-857

  Ibe, E ^a   Yahagi, Y ^a   Kataoka, F ^a   Saito, Y ^a   Eto, A ^a   Sato, M ^a   Kameyama, H ^b   Hidaka, M ^c  

^a HITACHI LTD   (Japan)

^b Hitachi Kodaira Semiconduct Co L   (Japan)

^c Elpida Memory Inc   (Japan)

Author keywords

Reliability; Scaling; Single event upset; Terrestrial neutron

Indexed keywords

SCALING; SINGLE EVENT UPSET; TERRESTRIAL NEUTRONS;

COMPUTER SIMULATION; ELEMENTARY PARTICLES; INFORMATION TECHNOLOGY; MONTE CARLO METHODS; NEUTRON IRRADIATION APPARATUS; PROTON BEAMS; RELIABILITY; STATIC RANDOM ACCESS STORAGE; ULSI CIRCUITS;

SEMICONDUCTOR DEVICES;

EID: 1842474957     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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