Drift-Free 10-kV, 20-A 4H-SiC PiN diodes

Journal of Electronic Materials

Volumn 34, Issue 4, 2005, Pages 341-344

  Hull, Brett A ^a   Das, Mrinal K ^a   Sumakeris, Joseph J ^a   Richmond, James T ^a   Krishnaswami, Sumi ^a  

^a Arkansas Power Electronics International Inc   (United States)

Author keywords

Basal plane dislocation (BPD); High voltage; PiN diode

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; CURRENT DENSITY; DIODES; ELECTROLUMINESCENCE; SEMICONDUCTOR JUNCTIONS; STACKING FAULTS;

BASAL PLANE DISLOCATION (BPD); HIGH VOLTAGE; PIN DIODE; VOLTAGE DROP (VF) DRIFT;

SILICON CARBIDE;

EID: 18244407292     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-005-0107-4     Document Type: Conference Paper

References (9)

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