Latest advances in high voltage, drift free, 4H-Sic Pa diodes

2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings

Volumn , Issue , 2003, Pages 364-365

  Das, Mrinal K ^a   Sumakeris, Joseph J ^a   Krishnaswami, Sumithra ^a   Paisley, Michael J ^a   Agarwal, Anant K ^a   Powell, Adrian ^a  

^a Arkansas Power Electronics International Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DENSITY; LEAKAGE CURRENTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES;

CONDUCTIVITY MODULATION; CRITICAL FIELDS; FORWARD BIAS; FORWARD VOLTAGE DROPS; HIGH RESISTANCE; LOW DEFECT DENSITIES; REVERSE LEAKAGE CURRENT; SIC PIN DIODES;

ELECTRIC RECTIFIERS;

EID: 27744494450     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISDRS.2003.1272137     Document Type: Conference Paper

References (2)

1. H. Lendenmann, J.P. Bergman, F. Dahlquist, and C. Hallin, Mat. Sci. Forum 433-436 (2003)901.
2. J. Sumakeris, M. Das, H. Hobgood, S. Muller, M. Paisley, S. Ha, M. Skowronski, J. Palmour and C. Carter Jr., ICSCRM 2003, Oct 2003, Lyon, France.