Direct imaging of temperature-dependent layered antiferromagnetism of a magnetic oxide

Physical Review Letters

Volumn 93, Issue 10, 2004, Pages

  Konoto, M ^a   Kohashi, T ^b   Koike, K ^c,d   Arima, T ^a,e   Kaneko, Y ^a   Kimura, T ^f,g   Tokura, Y ^a,d,f  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b HITACHI LTD   (Japan)

^c HOKKAIDO UNIVERSITY   (Japan)

^d NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^e UNIVERSITY OF TSUKUBA   (Japan)

^f UNIVERSITY OF TOKYO   (Japan)

^g LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; COMPUTER SIMULATION; CRYSTALLOGRAPHY; HEATING; LANTHANUM COMPOUNDS; MANGANESE COMPOUNDS; NEUTRON DIFFRACTION; OPTICAL SYSTEMS; PHOTOEMISSION; SCANNING ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; SINGLE CRYSTALS; TEMPERATURE CONTROL; ULTRAHIGH VACUUM; VECTORS;

MAGNETIC OXIDES; MAGNETIC STRUCTURES; SPIN POLARIZATION; X RAY PHOTOEMISSION ELECTRON MICROSCOPY;

ANTIFERROMAGNETISM;

EID: 18244392893     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.107201     Document Type: Article

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