Topology-induced spin frustrations at the Cr(001) surface studied by spin-polarized scanning tunneling spectroscopy

Physical Review Letters

Volumn 85, Issue 21, 2000, Pages 4606-4609

  Kleiber, M ^a   Bode, M ^a   Ravlic R ^a   Wiesendanger, R ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHROMIUM; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; FERMI LEVEL; POLARIZATION; SCANNING TUNNELING MICROSCOPY; TOPOLOGY;

SPIN FRUSTRATIONS; SPIN POLARIZED SCANNING TUNNELING SPECTROSCOPY;

FERROMAGNETISM;

EID: 0034323250     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.4606     Document Type: Article

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