Evidence of a topological antiferromagnetic order on ultrathin Cr(001) film surface studied by spin-polarized scanning tunneling spectroscopy

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6575-6577

  Kawagoe, T ^a,b   Suzuki, Y ^b,c   Bode, M ^d   Koike, K ^e  

^a OSAKA KYOIKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^d UNIVERSITY OF HAMBURG   (Germany)

^e HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIZATION; POLARIZATION; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

SPIN POLARIZATION;

MAGNETIC THIN FILMS;

EID: 0038315171     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1557352     Document Type: Conference Paper

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12. s = ±100 mV at the same area.