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Volumn 76, Issue 6, 2003, Pages 869-871

A miniaturized detector for high-resolution SEMPA

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; FERROMAGNETIC MATERIALS; KINETIC ENERGY; LOW ENERGY ELECTRON DIFFRACTION; POLARIZATION; SCANNING ELECTRON MICROSCOPY; ULTRATHIN FILMS;

EID: 0344519546     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-002-1966-7     Document Type: Conference Paper
Times cited : (7)

References (15)
  • 1
    • 0020275721 scopus 로고
    • ed. by K.F.J. Heinrich (San Francisco Press, San Francisco)
    • R.J. Celotta, D.T. Pierce: In: Microbeam Analysis, ed. by K.F.J. Heinrich (San Francisco Press, San Francisco 1982) p. 469
    • (1982) Microbeam Analysis , pp. 469
    • Celotta, R.J.1    Pierce, D.T.2
  • 12
    • 0344280761 scopus 로고    scopus 로고
    • UHV-Gemini column, developed by a cooperation of: OMICRON NanoTechnology GmbH, Taunusstein, Germany, LEO Elektronenmikroskopie GmbH, Oberkochen, Germany, CEOS GmbH, Heidelberg, Germany
    • UHV-Gemini column, developed by a cooperation of: OMICRON NanoTechnology GmbH, Taunusstein, Germany, LEO Elektronenmikroskopie GmbH, Oberkochen, Germany, CEOS GmbH, Heidelberg, Germany
  • 13
    • 0344712704 scopus 로고    scopus 로고
    • private communication
    • J. Westermann, private communication; see also http://www.omicron.de/nano/
    • Westermann, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.