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Volumn 82, Issue 1-2, 1996, Pages 79-85

Si CVV Auger line shapes: Tight binding model with inter-atomic phases

Author keywords

Auger cvv; Cini sawatzky; Line shape analysis; Silicon

Indexed keywords


EID: 0004768537     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(96)03039-3     Document Type: Article
Times cited : (8)

References (29)
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  • 8
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    • Ramaker, D.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.