Impact of oxygen ambient on ferroelectric properties of polar-axis-oriented CaBi4Ti4O15 films

Applied Physics Letters

Volumn 86, Issue 11, 2005, Pages 1-3

  Kato, Kazumi ^a,b   Tanaka, Kiyotaka ^a   Suzuki, Kazuyuki ^a   Kimura, Tatsuo ^a   Nishizawa, Kaori ^a   Miki, Takeshi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COMPOUNDS; CRYSTAL STRUCTURE; CRYSTALLIZATION; ELECTRODES; FERROELECTRIC MATERIALS; FERROELECTRICITY; HEAT TREATMENT; HIGH TEMPERATURE EFFECTS; MICROACTUATORS; OXYGEN; PEROVSKITE; POLARIZATION; RESONATORS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BOTTOM ELECTRODES; OXYGEN STOICHIOMETRY; SWITCHING POLARIZATION; VOLTAGE DEPENDENCE;

FERROELECTRIC THIN FILMS;

EID: 17944381475     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1883329     Document Type: Article

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