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Volumn 22, Issue 2, 2005, Pages 160-169

Using a periodic square wave test signal to detect crosstalk faults

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; COMPUTER SIMULATION; CROSSTALK; SQUARE WAVE GENERATORS; VLSI CIRCUITS; WAVEFORM ANALYSIS;

EID: 17844400935     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2005.49     Document Type: Article
Times cited : (20)

References (13)
  • 2
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  • 3
    • 0032316471 scopus 로고    scopus 로고
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    • (VTS 98), IEEE CS Press
    • K.T. Lee, C. Nordquist, and J.A. Abraham, "Automatic Test Pattern Generation for Crosstalk in Digital Circuits," Proc. 16th IEEE VLSI Test Symp. (VTS 98), IEEE CS Press, 1998, pp. 34-39.
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    • Lee, K.T.1    Nordquist, C.2    Abraham, J.A.3
  • 4
    • 17844407258 scopus 로고    scopus 로고
    • "A Model for Crosstalk Noise Evaluation in Deep Submicron Processes"
    • (ISQED 01), IEEE CS Press
    • P.B. Sabet and F. Ilponse, "A Model for Crosstalk Noise Evaluation in Deep Submicron Processes," Proc. 2nd Int'l Symp. Quality Electronic Design (ISQED 01), IEEE CS Press, 2001, pp. 139-144.
    • (2001) Proc. 2nd Int'l. Symp. Quality Electronic Design , pp. 139-144
    • Sabet, P.B.1    Ilponse, F.2
  • 5
    • 0028392267 scopus 로고
    • "An Approach to the Analysis and Detection of Crosstalk Faults in Digital VLSI Circuits"
    • Mar
    • A. Rubio et al., "An Approach to the Analysis and Detection of Crosstalk Faults in Digital VLSI Circuits," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol. 13, no. 3, Mar. 1994, pp. 359-369.
    • (1994) IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems , vol.13 , Issue.3 , pp. 359-369
    • Rubio, A.1
  • 6
    • 0029715011 scopus 로고    scopus 로고
    • "A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits"
    • (FTCS 96), IEEE CS Press
    • N. Itazaki, Y. Idomoto, and K. Kinoshita, "A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits," Proc. 26th Int'l Symp. Fault- Tolerant Computing (FTCS 96), IEEE CS Press, 1996, pp. 38-43.
    • (1996) Proc. 26th Int'l. Symp. Fault-Tolerant Computing , pp. 38-43
    • Itazaki, N.1    Idomoto, Y.2    Kinoshita, K.3
  • 7
    • 0034481918 scopus 로고    scopus 로고
    • "Analysis of Interconnect Crosstalk Defect Coverage of Test Sets"
    • (ITC 00), IEEE CS Press
    • Y. Zhao and S. Dey, "Analysis of Interconnect Crosstalk Defect Coverage of Test Sets," Proc. IEEE Int'l Test Conf. (ITC 00), IEEE CS Press, 2000, pp. 492-501.
    • (2000) Proc. IEEE Int'l. Test Conf. , pp. 492-501
    • Zhao, Y.1    Dey, S.2
  • 8
    • 0033684205 scopus 로고    scopus 로고
    • "Self-Test Methodology for At-Speed Test of Crosstalk in Chip Interconnects"
    • (DAC 00), ACM Press
    • X. Bai, S. Dey, and J. Rajski, "Self-Test Methodology for At-Speed Test of Crosstalk in Chip Interconnects," Proc. 37th Design Automation Conf. (DAC 00), ACM Press, 2000, pp. 614-624.
    • (2000) Proc. 37th Design Automation Conf. , pp. 614-624
    • Bai, X.1    Dey, S.2    Rajski, J.3
  • 9
    • 0035017462 scopus 로고    scopus 로고
    • "Embedded-Software-Based Approach to Testing Crosstalk-Induced Faults at On-Chip Buses"
    • (VTS 01), IEEE CS Press
    • W.C. Lai, J.R. Huang, and K.T. Cheng, "Embedded-Software-Based Approach to Testing Crosstalk-Induced Faults at On-Chip Buses," Proc. 19th IEEE VLSI Test Symp. (VTS 01), IEEE CS Press, 2001, pp. 204-209.
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  • 10
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    • W.Y. Chen, S.K. Gupta, and M.A. Bruer, "Test Generation for Crosstalk-Induced Faults: Framework and Computational Results," Proc. 9th Asian Test Symp. (ATS 00), IEEE CS Press, 2000, pp. 305-310.
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    • Chen, W.Y.1    Gupta, S.K.2    Bruer, A.M.3
  • 11
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    • (2002) Proc. 11th Asian Test Symp. , pp. 170-175
    • Wu, M.S.1
  • 13
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.