Diffraction-induced coherence levels

Applied Optics

Volumn 44, Issue 11, 2005, Pages 2202-2212

  Tavrov, Alexander ^a,b   Schmit, Joanna ^c   Kerwien, Norbert ^a   Osten, Wolfgang ^a   Tiziani, Hans ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

^c VEECO INSTRUMENTS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; BANDWIDTH; COMPUTER SIMULATION; DIFFRACTIVE OPTICS; INTERFEROMETRY; LIGHT INTERFERENCE; MICROSTRUCTURE; POLARIZATION; VECTOR QUANTIZATION;

BINARY OPTICS; LOW-COHERENCE FRINGES; NUMERICAL APERTURE (NA); WHITE LIGHT INTERFEROMETRY (WLI);

COHERENT LIGHT;

ARTICLE; BIOLOGICAL MODEL; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; IMAGE QUALITY; INSTRUMENTATION; METHODOLOGY; OPTICAL COHERENCE TOMOGRAPHY; PHASE CONTRAST MICROSCOPY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; VALIDATION STUDY;

COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY, INTERFERENCE; MODELS, BIOLOGICAL; PHANTOMS, IMAGING; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 17644399454     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.002202     Document Type: Article

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