-
1
-
-
0002988472
-
Temporal phase measurement methods
-
D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, U.K.,), Chap. 4
-
K. Creath, “Temporal phase measurement methods,” in Inter-ferogram Analysis: Digital Fringe Pattern Measurement Technique, D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, U.K., 1993), Chap. 4, pp. 94-140.
-
(1993)
Inter-Ferogram Analysis: Digital Fringe Pattern Measurement Technique
, pp. 94-140
-
-
Creath, K.1
-
2
-
-
85010176150
-
Phase shifting interferometers
-
2nd ed., D. Malacara, ed. (Wiley, New York, Chap
-
J. E. Greivenkamp and J. H. Bruning, “Phase shifting interferometers,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 14.
-
(1992)
Optical Shop Testing
, pp. 14
-
-
Greivenkamp, J.E.1
Bruning, J.H.2
-
3
-
-
0002020248
-
Spatial phase measurement methods
-
D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, U.K., Chap. 5
-
M. Kujawinska, “Spatial phase measurement methods,” in Interferogram Analysis: Digital Fringe Pattern Measurement Technique, D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, U.K., 1993), Chap. 5, pp. 141-193.
-
(1993)
Interferogram Analysis: Digital Fringe Pattern Measurement Technique
, pp. 141-193
-
-
Kujawinska, M.1
-
4
-
-
6144236464
-
Direct measuring interferometry
-
D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, U.K., Chap. 13.6
-
D. Malacara and S. L. DeVore, “Direct measuring interferometry,” in Interferogram Analysis: Digital Fringe Pattern Measurement Technique, D. W. Robinson and G. T. Reid, eds. (Institute of Physics, Bristol, U.K., 1993), Chap. 13.6, pp. 494-500, and references within.
-
(1993)
Interferogram Analysis: Digital Fringe Pattern Measurement Technique
, pp. 494-500
-
-
Malacara, D.1
Devore, S.L.2
-
5
-
-
85076346513
-
Spatial and temporal phase-measurement techniques: A comparison of major error sources in one-dimension
-
G. M. Brown, M. Kujawinska, O. Y. Kwon, and G. T. Reid, eds., Proc. SPIE 1755
-
J. Schmit, K. Creath, and M. Kujawinska, “Spatial and temporal phase-measurement techniques: a comparison of major error sources in one-dimension,” in Interferometry: Techniques and Analysis, G. M. Brown, M. Kujawinska, O. Y. Kwon, and G. T. Reid, eds., Proc. SPIE 1755, 202-211 (1992).
-
(1992)
Interferometry: Techniques and Analysis
, pp. 202-211
-
-
Schmit, J.1
Creath, K.2
Kujawinska, M.3
-
6
-
-
0030150015
-
W-point spatial phase measurement techniques for nondestructive testing
-
K. Creath and J. Schmit, “W-point spatial phase measurement techniques for nondestructive testing,” Opt. Lasers Eng. 24, 365-379 (1996).
-
(1996)
Opt. Lasers Eng.
, vol.24
, pp. 365-379
-
-
Creath, K.1
Schmit, J.2
-
7
-
-
84975635766
-
Least-squares estimation in phase-measurement interferometry
-
C. J. Morgan, “Least-squares estimation in phase-measurement interferometry,” Opt. Lett. 7, 368-373 (1982).
-
(1982)
Opt. Lett.
, vol.7
, pp. 368-373
-
-
Morgan, C.J.1
-
8
-
-
0021468528
-
Generalized data reduction for heterodyne interferometry
-
J. E. Greivenkamp, “Generalized data reduction for heterodyne interferometry,” Opt. Eng. 23, 350-352 (1984).
-
(1984)
Opt. Eng.
, vol.23
, pp. 350-352
-
-
Greivenkamp, J.E.1
-
9
-
-
0021463845
-
Interferometric phase measurement using spatial synchronous detection
-
K. H. Womack, “Interferometric phase measurement using spatial synchronous detection,” Opt. Eng. 23, 391-395 (1984).
-
(1984)
Opt. Eng.
, vol.23
, pp. 391-395
-
-
Womack, K.H.1
-
10
-
-
84893997835
-
Design and assessment of symmetrical phase-shifting algorithms
-
K. G. Larkin and B. F. Oreb, “Design and assessment of symmetrical phase-shifting algorithms,” J. Opt. Soc. Am. A 9, 1740-1748 (1992).
-
(1992)
J. Opt. Soc. Am. A
, vol.9
, pp. 1740-1748
-
-
Larkin, K.G.1
Oreb, B.F.2
-
11
-
-
84971649875
-
Fourier description of digital phase-measuring interferometry
-
K. Freischald and C. Koliopoulos, “Fourier description of digital phase-measuring interferometry,” J. Opt. Soc. Am. A 7, 542-551 (1990).
-
(1990)
J. Opt. Soc. Am. A
, vol.7
, pp. 542-551
-
-
Freischald, K.1
Koliopoulos, C.2
-
12
-
-
0027639231
-
Phase stepping: A new self-calibrating algorithm
-
Y. Surrel, “Phase stepping: a new self-calibrating algorithm,” Appl. Opt. 32, 3598-3600 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 3598-3600
-
-
Surrel, Y.1
-
13
-
-
77956979212
-
Advanced evaluation techniques in interferometry
-
E. Wolf, ed. (Elsevier, New York,), Chap. 4
-
J. Schwider, “Advanced evaluation techniques in interferometry,” in Progress in Optics Vol XXVIII, E. Wolf, ed. (Elsevier, New York, 1990), Chap. 4, pp. 271-359.
-
(1990)
Progress in Optics
, vol.28
, pp. 271-359
-
-
Schwider, J.1
-
14
-
-
0001009145
-
Extended averaging technique for derivation of error-compensating algorithms in phase shifting interferometry
-
J. Schmit and K. Creath, “Extended averaging technique for derivation of error-compensating algorithms in phase shifting interferometry,” Appl. Opt. 34, 3610-3619 (1995).
-
(1995)
Appl. Opt.
, vol.34
, pp. 3610-3619
-
-
Schmit, J.1
Creath, K.2
-
15
-
-
77955701859
-
Derivation of algorithms for phase-shifting interferometry using the concept of a data sampling window
-
P. de Groot, “Derivation of algorithms for phase-shifting interferometry using the concept of a data sampling window,” Appl. Opt. 34, 4723-4730 (1995).
-
(1995)
Appl. Opt.
, vol.34
, pp. 4723-4730
-
-
De Groot, P.1
-
16
-
-
0016128770
-
Digital wavefront measuring interferometer for testing optical surfaces and lenses
-
J. Bruning, D. H. Herriot, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangccio, “Digital wavefront measuring interferometer for testing optical surfaces and lenses,” Appl. Opt. 13, 2693-2703 (1974).
-
(1974)
Appl. Opt.
, vol.13
, pp. 2693-2703
-
-
Bruning, J.1
Herriot, D.H.2
Gallagher, J.E.3
Rosenfeld, D.P.4
White, A.D.5
Brangccio, D.J.6
-
17
-
-
0020844269
-
Digital wave-front measuring interferometry: Some systematic error sources
-
J. Schwider, R. Burow, K. E. Elsner, J. Grzanna, R. Spolaczyk, and K. Merkel, “Digital wave-front measuring interferometry: some systematic error sources,” Appl. Opt. 22, 3421-3432 (1983).
-
(1983)
Appl. Opt.
, vol.22
, pp. 3421-3432
-
-
Schwider, J.1
Burow, R.2
Elsner, K.E.3
Grzanna, J.4
Spolaczyk, R.5
Merkel, K.6
-
18
-
-
84928815585
-
Digital phase-shifting interferometry: A simple error-compensating phase calculation algorithm
-
P. Hariharan, B. F. Oreb, and T. Eiju, “Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,” Appl. Opt. 26, 2504-2505 (1987).
-
(1987)
Appl. Opt.
, vol.26
, pp. 2504-2505
-
-
Hariharan, P.1
Oreb, B.F.2
Eiju, T.3
-
19
-
-
0027652424
-
New compensating four-phase algorithm for phase-shift interferometry
-
J. Schwider, O. Falkenstorfer, H. Screiber, A. Zoller, and N. Streibl, “New compensating four-phase algorithm for phase-shift interferometry,” Opt. Eng. 32, 1883-1885 (1993).
-
(1993)
Opt. Eng.
, vol.32
, pp. 1883-1885
-
-
Schwider, J.1
Falkenstorfer, O.2
Screiber, H.3
Zoller, A.4
Streibl, N.5
-
20
-
-
0029288253
-
Phase shifting for nonsinusoidal waveforms with phase-shift errors
-
K. Hibino, B. F. Oreb, D. I. Farrant, and K. G. Larkin, “Phase shifting for nonsinusoidal waveforms with phase-shift errors,” J. Opt. Soc. Am. A. 12, 761-768 (1995).
-
(1995)
J. Opt. Soc. Am. A.
, vol.12
, pp. 761-768
-
-
Hibino, K.1
Oreb, B.F.2
Farrant, D.I.3
Larkin, K.G.4
-
21
-
-
0028745825
-
Long-wavelength laser diode interferometer for surface flatness measurement
-
C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248
-
P. de Groot and L. Deck, “Long-wavelength laser diode interferometer for surface flatness measurement,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki and R. W. Preater, eds., Proc. SPIE 2248, 136-140 (1994).
-
(1994)
Optical Measurements and Sensors for the Process Industries
, pp. 136-140
-
-
De Groot, P.1
Deck, L.2
-
22
-
-
0002562479
-
Spatial carrier fringe pattern analysis and its application to precision interferometry: An overview
-
M. Takeda, “Spatial carrier fringe pattern analysis and its application to precision interferometry: an overview,” Ind. Met. 1, 79-99 (1990).
-
(1990)
Ind. Met.
, vol.1
, pp. 79-99
-
-
Takeda, M.1
-
23
-
-
0025792386
-
High accuracy fourier transform fringe pattern analysis
-
M. Kujawinska and J. Wojciak, “High accuracy fourier transform fringe pattern analysis,” Opt. Lasers Eng. 14, 325-339 (1991).
-
(1991)
Opt. Lasers Eng.
, vol.14
, pp. 325-339
-
-
Kujawinska, M.1
Wojciak, J.2
-
25
-
-
6144266101
-
A study of the effect of windowing on the accuracy of surface measurements obtained from the Fourier analysis of fringe pattern
-
(The Fringe Analysis Special Interest Group
-
A. A. Malcolm, D. R. Burton, and M. J. A. Lalor, “A study of the effect of windowing on the accuracy of surface measurements obtained from the Fourier analysis of fringe pattern,” in Proceedings of FASIG Fringe Analysis’89, Loughborough University of Technology, 4-5 April 1989 (The Fringe Analysis Special Interest Group, 1989).
-
(1989)
Proceedings of FASIG Fringe Analysis’89, Loughborough University of Technology, 4-5 April 1989
-
-
Malcolm, A.A.1
Burton, D.R.2
Lalor, M.J.A.3
-
26
-
-
0028476358
-
Phase-measuring interferometry: New methods and error analysis
-
C. Joenathan, “Phase-measuring interferometry: new methods and error analysis,” Appl. Opt. 33, 4147-4155 (1994).
-
(1994)
Appl. Opt.
, vol.33
, pp. 4147-4155
-
-
Joenathan, C.1
-
27
-
-
84975648049
-
Phase-shift calibration errors in interferometers with spherical Fizeau cavities
-
P. de Groot, “Phase-shift calibration errors in interferometers with spherical Fizeau cavities,” Appl. Opt. 34, 2856 -2863 (1995).
-
(1995)
Appl. Opt.
, vol.34
-
-
De Groot, P.1
-
28
-
-
0019035988
-
Direct measurement of phase in a spherical-wave Fizeau interferometer
-
R. C. Moore and F. H. Slaymaker, “Direct measurement of phase in a spherical-wave Fizeau interferometer,” Appl. Opt. 19, 2196-2200 (1980).
-
(1980)
Appl. Opt.
, vol.19
, pp. 2196-2200
-
-
Moore, R.C.1
Slaymaker, F.H.2
-
29
-
-
0028192727
-
Phase-shifting errors in interferometric tests with high-numerical-aperture reference surfaces
-
K. Creath and P. Hariharan, “Phase-shifting errors in interferometric tests with high-numerical-aperture reference surfaces,” Appl. Opt. 33, 24-25 (1994).
-
(1994)
Appl. Opt.
, vol.33
, pp. 24-25
-
-
Creath, K.1
Hariharan, P.2
|