-
1
-
-
0027639146
-
Interferometric profiler for rough surfaces
-
P. J. Caber, “Interferometric profiler for rough surfaces,” Appl. Opt. 32, 3438-3441 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 3438-3441
-
-
Caber, P.J.1
-
2
-
-
0028545665
-
High-speed noncontact profiler based on scanning white-light interferometry
-
L. Deck and P. de Groot, “High-speed noncontact profiler based on scanning white-light interferometry,” Appl. Opt. 33, 7334-7338 (1994).
-
(1994)
Appl. Opt.
, vol.33
, pp. 7334-7338
-
-
Deck, L.1
De Groot, P.2
-
3
-
-
0029409006
-
White-light phase-stepping interferometry: Measurement of the fractional interference or der
-
P. Hariharan and M. Roy, “White-light phase-stepping interferometry: measurement of the fractional interference or der,” J. Mod. Opt. 42, 2357-2360 (1995).
-
(1995)
J. Mod. Opt.
, vol.42
, pp. 2357-2360
-
-
Hariharan, P.1
Roy, M.2
-
4
-
-
0000054238
-
Efficient nonlinear algorithm for envelope detection in white light interferometry
-
K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white light interferometry,” J. Opt. Soc. Am. A 13, 4, 832-843 (1996).
-
(1996)
J. Opt. Soc. Am. A
, vol.13
, Issue.4
, pp. 832-843
-
-
Larkin, K.G.1
-
5
-
-
0000137961
-
Unambiguous profilom-etry by fringe-order identification in white-light phase-shifting interferometry
-
P. Sandoz, R. Devillers, and A. Plata, “Unambiguous profilom-etry by fringe-order identification in white-light phase-shifting interferometry,” J. Mod. Opt. 44, 519-534 (1997).
-
(1997)
J. Mod. Opt.
, vol.44
, pp. 519-534
-
-
Sandoz, P.1
Devillers, R.2
Plata, A.3
-
6
-
-
33645158905
-
Processing of white light corre-lograms: Simultaneous phase and envelope measurements by wavelet transformation
-
C. Gorecki, ed. Proc. SPIE
-
P. Sandoz and M. Jacquot, “Processing of white light corre-lograms: simultaneous phase and envelope measurements by wavelet transformation,” in Optical Inspection and Micromeasurements II, C. Gorecki, ed. Proc. SPIE 3098, 73-82 (1997).
-
(1997)
Optical Inspection and Micromeasurements II
, vol.3098
, pp. 73-82
-
-
Sandoz, P.1
Jacquot, M.2
-
7
-
-
0032028084
-
Analysis of white light inter-ferograms using wavelet methods
-
R. J. Recknagel and G. Notni, “Analysis of white light inter-ferograms using wavelet methods,” Opt. Commun. 148, 122-128 (1998).
-
(1998)
Opt. Commun.
, vol.148
, pp. 122-128
-
-
Recknagel, R.J.1
Notni, G.2
-
8
-
-
0000471184
-
Interferometric measurement of surface roughness in engine cylinder walls
-
D. J. Aziz, “Interferometric measurement of surface roughness in engine cylinder walls,” Opt. Eng. 37, 1429-1434 (1998).
-
(1998)
Opt. Eng.
, vol.37
, pp. 1429-1434
-
-
Aziz, D.J.1
-
9
-
-
0000062023
-
Fast algorithms for the data reduction in modern optical 3-D profile measurement systems using MMX technology
-
M. Fleischer, R. Windecker, and H. J. Tiziani, “Fast algorithms for the data reduction in modern optical 3-D profile measurement systems using MMX technology,” Appl. Opt. 39, 1290-1297 (2000).
-
(2000)
Appl. Opt.
, vol.39
, pp. 1290-1297
-
-
Fleischer, M.1
Windecker, R.2
Tiziani, H.J.3
-
10
-
-
0022670709
-
Time delay estimation by combining efficient algorithms and generalized cross-correlation
-
D. Hertz, “Time delay estimation by combining efficient algorithms and generalized cross-correlation,” IEEE Trans. Acoust. Speech Signal Process. 34, 1-7 (1986).
-
(1986)
IEEE Trans. Acoust. Speech Signal Process.
, vol.34
, pp. 1-7
-
-
Hertz, D.1
|