Edge localization of subwavelength structures by use of polarization interferometry and extreme-value criteria

Applied Optics

Volumn 39, Issue 34, 2000, Pages 6295-6305

  Totzeck, Michael ^a   Jacobsen, Harald ^a   Tiziani, Hans J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INTERFEROMETRY; LIQUID CRYSTALS; OPTICAL MICROSCOPY; PHASE SHIFT;

EDGE LOCALIZATION;

LIGHT POLARIZATION;

EID: 0000585533     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.006295     Document Type: Article

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