Gate-capacitance extraction from RF C-V measurements

ESSCIRC 2004 - Proceedings of the 34th European Solid-State Device Research Conference

Volumn , Issue , 2004, Pages 113-116

  Sasse, G T ^a   De Kort, R ^b   Schmitz, J ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; ELECTRIC IMPEDANCE; EXTRACTION; LEAKAGE CURRENTS; MATRIX ALGEBRA; PARAMETER ESTIMATION; SEMICONDUCTOR LASERS;

CHANNEL IMPEDANCE; JUNCTION CAPACITANCE; ONE-PORT DATA; PARALLEL IMPEDANCE;

GATES (TRANSISTOR);

EID: 17644393901     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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