Deep-level optical spectroscopy investigation of N-doped TiO2 films

Applied Physics Letters

Volumn 86, Issue 13, 2005, Pages 1-3

  Nakano, Yoshitaka ^a   Morikawa, Takeshi ^a   Ohwaki, Takeshi ^a   Taga, Yasunori ^a  

^a Rd Management Section   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; DOPING (ADDITIVES); GRAIN BOUNDARIES; MAGNETRON SPUTTERING; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

BAND GAP; CONDUCTION BAND; DEEP-LEVEL OPTICAL SPECTROSCOPY (DLOS); DOPANTS;

SEMICONDUCTING FILMS;

EID: 17644393503     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1896450     Document Type: Article

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