Correlation between proton and heavy-ion SEUs in commercial memory devices

IEEE Radiation Effects Data Workshop

Volumn 2003-January, Issue , 2003, Pages 127-132

  Chiba, K ^a   Nashiyama, I ^a   Sugimoto, K ^a   Nemoto, N ^a   Asai, H ^b   Iide, Y ^b   Shindo, H ^b   Ikeda, N ^b   Kuboyama, S ^b   Matsuda, S ^b  

^a Engineering Dep   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; RADIATION EFFECTS; STATIC RANDOM ACCESS STORAGE;

EMPIRICAL EQUATIONS; SEU CROSS-SECTION;

HEAVY IONS;

EID: 11044223174     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2003.1281363     Document Type: Conference Paper

References (10)

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10. R. Koga, et al.: Comparison of Heavy Ion and Proton-Induced Single Event Effects (SEE) Sensitivity, IEEE Trans. on Nucl. Sci., NS-49, No.6 (2002), pp. 3135-3141.