Single event functional interrupt (SEFI) sensitivity in microcircuits

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 311-318

  Koga, R ^a   Penzin, S H ^a   Crawford, K B ^a   Crain, W R ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; HEAVY IONS; INTEGRATED CIRCUIT TESTING; ION BOMBARDMENT; MICROELECTRONICS; SENSITIVITY ANALYSIS;

MICROCIRCUITS; SINGLE EVENT FUNCTIONAL INTERRUPT SENSITIVITY; SUSCEPTIBILITY MEASUREMENT;

RADIATION EFFECTS;

EID: 0031623637     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)