Probing the negative permittivity perfect lens at optical frequencies using near-field optics and single molecule detection

Optics Express

Volumn 13, Issue 5, 2005, Pages 1604-1614

  Moerland, Robert J ^a   Van Hulst, Niek F ^a   Gersen, Henkjan ^b   Kuipers, Laurens ^c  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b AARHUS UNIVERSITY   (Denmark)

^c FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTROMAGNETIC WAVES; IMAGE ANALYSIS; MAGNETIC PERMEABILITY; OPTICAL MICROSCOPY; SCANNING;

NEAR-FIELD OPTICS; OPTICAL FREQUENCIES; SUPERRESOLUTION; SURFACE PLASMONS;

LENSES;

EID: 17444393625     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.001604     Document Type: Article

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