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1
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17144416924
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Integrated passive filter incorporating inductors and ESD protectors
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Final Program & Abstract Book, (Marco Island, Fla.), January
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D. Richiuso, A. Brankov and R. Liu, "Integrated Passive Filter Incorporating Inductors and ESD Protectors," Final Program & Abstract Book, IMAPS Workshop on Passive Integration (Marco Island, Fla.), January 2005.
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(2005)
IMAPS Workshop on Passive Integration
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Richiuso, D.1
Brankov, A.2
Liu, R.3
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3
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17144389060
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Laser assisted advanced packaging for solder ball attach/bumping
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Abstracts & Final Program, (Baltimore, Md.), March
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T. Teusch, R.G. Blankenhorn, L. Titerle, E. Zakel and G. Azdasht, "Laser Assisted Advanced Packaging for Solder Ball Attach/Bumping," Abstracts & Final Program, IMAPS Workshop on Military, Aerospace, Space and Homeland Security Packaging Issues (Baltimore, Md.), March 2003.
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(2003)
IMAPS Workshop on Military, Aerospace, Space and Homeland Security Packaging Issues
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Teusch, T.1
Blankenhorn, R.G.2
Titerle, L.3
Zakel, E.4
Azdasht, G.5
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5
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17144376483
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Wafer scale flip-chip technology for HgCdTe IRFPA
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Abstracts & Final Program, (Baltimore, Md.), March
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M. Fendler, et al., "Wafer Scale Flip-Chip Technology for HgCdTe IRFPA," Abstracts & Final Program, IMAPS Workshop on Military, Aerospace, Space and Homeland Security Packaging Issues (Baltimore, Md.), March 2003.
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(2003)
IMAPS Workshop on Military, Aerospace, Space and Homeland Security Packaging Issues
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Fendler, M.1
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6
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18144413062
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Semiconductor International, February
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P. Garrou, "Future ICs Go Vertical," Semiconductor International, February 2005, p. SP-10.
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(2005)
Future ICs Go Vertical
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Garrou, P.1
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8
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0032688683
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Recent advances in flip chip wafer bumping using solder paste technology
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P. Elenius, J. Leal, J. Ney, D. Stepniak and S. Yeh, "Recent Advances in Flip Chip Wafer Bumping Using Solder Paste Technology," ECTC 1999.
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ECTC 1999
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Elenius, P.1
Leal, J.2
Ney, J.3
Stepniak, D.4
Yeh, S.5
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9
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84892822881
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Electromigration and UBM failure: Failure mechanisms due to current and temperature
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P. Elenius, "Electromigration and UBM Failure: Failure Mechanisms Due to Current and Temperature," IMAPS Flip Chip 2001 Workshop Presentations.
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IMAPS Flip Chip 2001 Workshop Presentations
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Elenius, P.1
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10
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0035340967
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Conversion of under bump metallurgy into intermetallics: The impact on flip-chip reliability
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May
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F. Stepniak, "Conversion of Under Bump Metallurgy Into Intermetallics: The Impact on Flip-Chip Reliability," Microelectronics Reliability, May 2001, p. 735.
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(2001)
Microelectronics Reliability
, pp. 735
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Stepniak, F.1
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11
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0038689327
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Copper doped eutectic tin-lead bump for power flip chip application
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S. Yeh, "Copper Doped Eutectic Tin-Lead Bump for Power Flip Chip Application," ECTC 2003.
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ECTC 2003
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Yeh, S.1
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12
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17144410067
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Enhanced euteetic solder bump for increased flip chip reliability
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M. Johnson, H. Balkan and S. Yeh, "Enhanced Euteetic Solder Bump for Increased Flip Chip Reliability," APEX 2004.
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APEX 2004
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Johnson, M.1
Balkan, H.2
Yeh, S.3
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13
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84860930653
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"Lead-Based Solder Alloys Containing Copper," U.S. Patent 6,811,892
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S. Yeh, B. Carter, F. Stepniak and S. Brandenburg, "Lead-Based Solder Alloys Containing Copper," U.S. Patent 6,811,892.
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Yeh, S.1
Carter, B.2
Stepniak, F.3
Brandenburg, S.4
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14
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17144409134
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The effect of copper content on the reliability of SnAg-based bump alloys in flip chip applications
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S. Yeh, "The Effect of Copper Content on the Reliability of SnAg-Based Bump Alloys in Flip Chip Applications," Surface Mount International Symp., 2002.
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(2002)
Surface Mount International Symp.
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Yeh, S.1
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15
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84860939620
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"Lead-Free Solder Alloy and Solder Reflow Process" U.S. Patent 6,767,411
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S. Yeh, B. Carter and C. Melcher, "Lead-Free Solder Alloy and Solder Reflow Process" U.S. Patent 6,767,411.
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Yeh, S.1
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Melcher, C.3
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