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Volumn 28, Issue 4, 2005, Pages

Wafer bumping: Fine-pitch and lead-free solder

Author keywords

[No Author keywords available]

Indexed keywords

AVX CORP (CO); CALIFORNIA MICRO DEVICES (CMD) (CO); IBM (CO); INFINEON (CO); INTEL (CO); LEAD-FREE SOLDERS; UNITIVE (CO); WAFER-LEVEL PACKAGING (WLP);

EID: 17144398815     PISSN: 01633767     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review
Times cited : (3)

References (15)
  • 1
    • 17144416924 scopus 로고    scopus 로고
    • Integrated passive filter incorporating inductors and ESD protectors
    • Final Program & Abstract Book, (Marco Island, Fla.), January
    • D. Richiuso, A. Brankov and R. Liu, "Integrated Passive Filter Incorporating Inductors and ESD Protectors," Final Program & Abstract Book, IMAPS Workshop on Passive Integration (Marco Island, Fla.), January 2005.
    • (2005) IMAPS Workshop on Passive Integration
    • Richiuso, D.1    Brankov, A.2    Liu, R.3
  • 6
    • 18144413062 scopus 로고    scopus 로고
    • Semiconductor International, February
    • P. Garrou, "Future ICs Go Vertical," Semiconductor International, February 2005, p. SP-10.
    • (2005) Future ICs Go Vertical
    • Garrou, P.1
  • 8
    • 0032688683 scopus 로고    scopus 로고
    • Recent advances in flip chip wafer bumping using solder paste technology
    • P. Elenius, J. Leal, J. Ney, D. Stepniak and S. Yeh, "Recent Advances in Flip Chip Wafer Bumping Using Solder Paste Technology," ECTC 1999.
    • ECTC 1999
    • Elenius, P.1    Leal, J.2    Ney, J.3    Stepniak, D.4    Yeh, S.5
  • 9
    • 84892822881 scopus 로고    scopus 로고
    • Electromigration and UBM failure: Failure mechanisms due to current and temperature
    • P. Elenius, "Electromigration and UBM Failure: Failure Mechanisms Due to Current and Temperature," IMAPS Flip Chip 2001 Workshop Presentations.
    • IMAPS Flip Chip 2001 Workshop Presentations
    • Elenius, P.1
  • 10
    • 0035340967 scopus 로고    scopus 로고
    • Conversion of under bump metallurgy into intermetallics: The impact on flip-chip reliability
    • May
    • F. Stepniak, "Conversion of Under Bump Metallurgy Into Intermetallics: The Impact on Flip-Chip Reliability," Microelectronics Reliability, May 2001, p. 735.
    • (2001) Microelectronics Reliability , pp. 735
    • Stepniak, F.1
  • 11
    • 0038689327 scopus 로고    scopus 로고
    • Copper doped eutectic tin-lead bump for power flip chip application
    • S. Yeh, "Copper Doped Eutectic Tin-Lead Bump for Power Flip Chip Application," ECTC 2003.
    • ECTC 2003
    • Yeh, S.1
  • 12
    • 17144410067 scopus 로고    scopus 로고
    • Enhanced euteetic solder bump for increased flip chip reliability
    • M. Johnson, H. Balkan and S. Yeh, "Enhanced Euteetic Solder Bump for Increased Flip Chip Reliability," APEX 2004.
    • APEX 2004
    • Johnson, M.1    Balkan, H.2    Yeh, S.3
  • 13
    • 84860930653 scopus 로고    scopus 로고
    • "Lead-Based Solder Alloys Containing Copper," U.S. Patent 6,811,892
    • S. Yeh, B. Carter, F. Stepniak and S. Brandenburg, "Lead-Based Solder Alloys Containing Copper," U.S. Patent 6,811,892.
    • Yeh, S.1    Carter, B.2    Stepniak, F.3    Brandenburg, S.4
  • 14
    • 17144409134 scopus 로고    scopus 로고
    • The effect of copper content on the reliability of SnAg-based bump alloys in flip chip applications
    • S. Yeh, "The Effect of Copper Content on the Reliability of SnAg-Based Bump Alloys in Flip Chip Applications," Surface Mount International Symp., 2002.
    • (2002) Surface Mount International Symp.
    • Yeh, S.1
  • 15
    • 84860939620 scopus 로고    scopus 로고
    • "Lead-Free Solder Alloy and Solder Reflow Process" U.S. Patent 6,767,411
    • S. Yeh, B. Carter and C. Melcher, "Lead-Free Solder Alloy and Solder Reflow Process" U.S. Patent 6,767,411.
    • Yeh, S.1    Carter, B.2    Melcher, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.