Femtosecond spectroscopy of defect modes in silica glasses

Applied Physics Letters

Volumn 86, Issue 8, 2005, Pages 1-3

  Guillon, C ^a   Burgin, J ^a   Langot, P ^a   Valle F ^a   Hehlen, B ^b  

^a UMR 5798   (France)

^b UMR 5568 ISTEEM CNRS Univ M   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; FREQUENCIES; RAMAN SPECTROSCOPY; SILICA; SPECTROSCOPIC ANALYSIS; TIME DOMAIN ANALYSIS;

DEFECT MODES; FEMTOSECOND SPECTROSCOPY; FULL WIDTH AT HALF MAXIMUM (FWHM); SILICA GLASSES;

GLASS;

EID: 17044430700     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1867566     Document Type: Article

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