Concentration of small ring structures in vitreous silica from a first-principles analysis of the Raman spectrum

Physical Review Letters

Volumn 90, Issue 2, 2003, Pages

  Umari, P ^a   Gonze, Xavier ^b   Pasquarello, Alfredo ^a  

^a EPFL   (Switzerland)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DIELECTRIC DEVICES; FINITE DIFFERENCE METHOD; FREQUENCIES; LIGHT POLARIZATION; PERTURBATION TECHNIQUES; RAMAN SPECTROSCOPY; TENSORS;

FIRST PRINCIPLES ANALYSIS; OXYGEN BENDING MOTION; RAMAN COUPLING TENSOR; RAMAN DEFECT LINES; SMALL RING STRUCTURE;

FUSED SILICA;

EID: 0037449902     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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