Identification of raman defect lines as signatures of ring structures in vitreous silica

Physical Review Letters

Volumn 80, Issue 23, 1998, Pages 5145-5147

  Pasquarello, Alfredo ^a,b   Car, Roberto ^a,b  

^a INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA   (Switzerland)

^b UNIVERSITY OF GENEVA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000977215     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.5145     Document Type: Article

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