Structure and morphology of self-assembled 3-mercaptopropyltrimethoxysilane layers on silicon oxide

Applied Surface Science

Volumn 181, Issue 3-4, 2001, Pages 307-316

  Hu, Minghui ^a   Noda, Suguru ^a   Okubo, Tatsuya ^a   Yamaguchi, Yukio ^a   Komiyama, Hiroshi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Atomic force microscopy; Self assembled monolayers; Silicon oxide; Surface modification; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONCENTRATION (PROCESS); DEHYDRATION; MONOLAYERS; MORPHOLOGY; POLYMERIZATION; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SILANES; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

SILICON OXIDE;

SILICA;

EID: 0035928972     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00399-3     Document Type: Article

References (30)