Electrical and optical properties of ZnO:Al films prepared by an evaporation method

Thin Solid Films

Volumn 279, Issue 1-2, 1996, Pages 213-215

  Ma, Jin ^a   Ji, Feng ^a   Ma, Hong Lei ^a   Li, Shu Ying ^a  

^a SHANDONG UNIVERSITY   (China)

Author keywords

Conductivity; X ray diffraction; Zinc oxide

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; EVAPORATION; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; STRUCTURE (COMPOSITION); TRANSPARENCY; X RAY DIFFRACTION; ZINC OXIDE;

ALUMINUM CHLORIDE; ALUMINUM DOPED ZINC OXIDE FILMS; ELECTRON CARRIER DENSITIES; OPTO-ELECTRICAL PROPERTIES; THERMAL EVAPORATION; ZINC ACETATE;

THIN FILMS;

EID: 0030171128     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)08173-9     Document Type: Article

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