Effect of tensile offset angles on micro/nanoscale tensile testing

Review of Scientific Instruments

Volumn 76, Issue 3, 2005, Pages

  Li, Xiaodong ^a   Wang, Xinnan ^a   Chang, Wei Che ^a   Chao, Yuh J ^a   Chang, Ming ^b  

^a University of South Carolina   (United States)

^b CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

NANOMECHANICS; NANOTENSILE TESTER; SENSING SYSTEMS; TENSILE OFFSET ANGLES;

CALIBRATION; CARBON NANOTUBES; ELASTIC MODULI; FINITE ELEMENT METHOD; IMAGING SYSTEMS; SCANNING ELECTRON MICROSCOPY; TENSILE TESTING;

NANOSTRUCTURED MATERIALS;

EID: 17044376606     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1865732     Document Type: Article

References (10)

1. X. Li, B. Bhushan, K. Takashima, C.-W. Baek, and Y.-K. Kim, Ultramicroscopy 97, 481 (2003).
2. B. Bhushan and X. Li, Int. Mater. Rev. 48, 125 (2003).
3. X. Li and B. Bhushan, Mater. Charact. 48, 11 (2002).
4. X. Li and B. Bhushan, Surf. Coat. Technol. 163-164, 503 (2003).
5. X. Li, H. Gao, C. J. Murphy, and K. K. Caswell, Nano Lett. 3, 1495 (2003).
6. M. F. Yu, O. Lourie, M. J. Dyer, K. Moloni, T. F. Kelly, and R. S. Ruoff, Science 287, 637 (2000).
7. M. F. Yu, B. S. Files, S. Arepalli, and R. S. Ruoff, Phys. Rev. Lett. 84, 5552 (2000).
8. M. F. Yu, B. I. Yakobson, and R. S. Ruoff, J. Phys. Chem. B 104, 8764 (2000).
9. Z. W. Pan, S. S. Xie, L. Lu, B. H. Chang, L. F. Sun, W. Y. Zhou, G. Wang, and D. L. Zhang, Appl. Phys. Lett. 74, 3152 (1999).
10. F. Li, H. M. Chang, S. Bai, G. Su, and M. S. Dresselhaus, Appl. Phys. Lett. 77, 3161 (2000).