Influence of composition, exposure and thermal annealing on optical properties of As-S chalcogenide thin films

Journal of Optoelectronics and Advanced Materials

Volumn 6, Issue 1, 2004, Pages 139-148

  Ohlidal I ^a   Franta, D ^a   Frumar, M ^b   Jedelesky J ^a   Omasta, J ^a  

^a MASARYK UNIVERSITY   (Czech Republic)

^b UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

As S chalcogenide films; Ellipsometry; Optical constants; Transmission

Indexed keywords

ANNEALING; ELLIPSOMETRY; OPTICAL PROPERTIES; PARAMETER ESTIMATION; SPECTRUM ANALYSIS; SURFACE TREATMENT; THICKNESS MEASUREMENT; THIN FILMS; ULTRAVIOLET RADIATION;

AS-S CHALCOGENIDE FILMS; OPTICAL CONSTANTS;

ARSENIC COMPOUNDS;

EID: 16744363896     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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