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Volumn 3, Issue 4, 2001, Pages 873-878
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Complete optical analysis of amorphous As-S chalcogenide thin films by the combined spectrophotometric method
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Author keywords
Amorphous materials; As s chalcogenide films; Combined spectrophotometric method; Optical constants
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Indexed keywords
AMORPHOUS MATERIALS;
CHALCOGENIDES;
DISPERSION (WAVES);
OPTICAL CONSTANTS;
REFLECTION;
REFRACTIVE INDEX;
SPECTROPHOTOMETERS;
SPECTROPHOTOMETRY;
SUBSTRATES;
CHALCOGENIDE FILMS;
CHALCOGENIDE MATERIALS;
CHALCOGENIDE THIN FILMS;
DISPERSION PARAMETERS;
OPTICAL CHARACTERIZATION;
REFRACTIVE INDEX PROFILES;
SPECTRAL DEPENDENCES;
SPECTRO-PHOTOMETRIC METHOD;
THIN FILMS;
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EID: 0347122398
PISSN: 14544164
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (4)
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References (8)
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